Informatics / TAMS / Applets / VLSI chip yield demonstration
Description
 This applet demonstrates the effect of random (point) defects on VLSI chip yield. Use the sliders to select the chip size (width and height) and the number of defects per wafer. Next, press the Apply selected values button to generate a wafer filled with chips of the selected size, and the specified total number of defects (shown as black dots). Good chips are marked green, while bad chips are shown in red. Press the Apply selected values button again to generate a new wafer with the same number of chips but different location of defects. Use the Apply random values button to generate a wafer with random chip size and random number of defects per wafer.

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Yield
demonstration
applet
  

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30.04.2003 Impressum
 http://tams-www.informatik.uni-hamburg.de/applets/yield/index.html